3 March 2008 Performance measurement of phosphor screens used in optoelectronic image devices
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Proceedings Volume 6621, International Symposium on Photoelectronic Detection and Imaging 2007: Photoelectronic Imaging and Detection; 66210G (2008); doi: 10.1117/12.790601
Event: International Symposium on Photoelectronic Detection and Imaging: Technology and Applications 2007, 2007, Beijing, China
Abstract
To obtain high quality optoelectronic image devices, the phosphor screens should be evaluated before assembled in the devices. The principle and method of measurement are expounded. A measurement system is developed, which can measure luminous efficiency, luminance, non-uniformity of luminance and persistence of phosphor screen. It can also detect the flaws of screen. The system consists of vacuum chamber, electron gun, electrostatic lens system, high voltage supply, imaging luminance meter, luminous flux tester, control units, signal processing circuit, A/D converter, D/A converter, communication unit, industrial computer and measurement software.
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YunSheng Qian, YaFeng Qiu, Hui Li, BenKang Chang, "Performance measurement of phosphor screens used in optoelectronic image devices", Proc. SPIE 6621, International Symposium on Photoelectronic Detection and Imaging 2007: Photoelectronic Imaging and Detection, 66210G (3 March 2008); doi: 10.1117/12.790601; https://doi.org/10.1117/12.790601
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KEYWORDS
Imaging systems

Electron beams

Optoelectronic devices

Luminous efficiency

Telecommunications

Computing systems

Control systems

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