3 March 2008 Statistical analysis of dark noise in photon imaging system
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Proceedings Volume 6621, International Symposium on Photoelectronic Detection and Imaging 2007: Photoelectronic Imaging and Detection; 66210I (2008) https://doi.org/10.1117/12.790659
Event: International Symposium on Photoelectronic Detection and Imaging: Technology and Applications 2007, 2007, Beijing, China
Abstract
A photon imaging system (PIS), which consists of object lens, micro-channel plate (MCP), photomultiplier tube, relay lens, CCD camera and image acquisition system is recently constructed. The dark noise of the whole imaging system has been studied by statistical analysis method. The hypothesis tests method is used to analyze statistical parameters of dark noise. In this test, the Chi-square goodness-of-fit test method is employed to determine which distribution the acquired image information is fit for. Subsequently, the section estimation is used to confirm threshold for spatial denoising process. In order to overcome the effects of the non-uniformity for PIS, we propose a new method to analyze above processes. In this method the image acquired by PIS was divided into many segments, their statistical characters have been studied respectively and the statistical parameters of the noise for the different segments are analyzed based on above method. For the aim of analyzing above acquired statistical parameters and obtaining the relationship in terms of the different operating conditions of the system, several experiments have been implemented and experiment results also be presented.
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Lei Zhao, Xin Yu, Yi-nan Chen, "Statistical analysis of dark noise in photon imaging system", Proc. SPIE 6621, International Symposium on Photoelectronic Detection and Imaging 2007: Photoelectronic Imaging and Detection, 66210I (3 March 2008); doi: 10.1117/12.790659; https://doi.org/10.1117/12.790659
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