22 February 2008 Improved cutback method measuring beat-length for high-birefringence optical fiber by fitting data of photoelectric signal
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Proceedings Volume 6622, International Symposium on Photoelectronic Detection and Imaging 2007: Laser, Ultraviolet, and Terahertz Technology; 662216 (2008) https://doi.org/10.1117/12.790822
Event: International Symposium on Photoelectronic Detection and Imaging: Technology and Applications 2007, 2007, Beijing, China
Abstract
A photoelectric measurement system for measuring the beat length of birefringence fiber is set up including a set of rotating-wave-plate polarimeter using single photodiode. And two improved cutback methods suitable for measuring beat-length within millimeter range of high birefringence fiber are proposed through data processing technique. The cut length needs not to be restricted shorter than one centimeter so that the auto-cleaving machine is freely used, and no need to carefully operate the manually cleaving blade with low efficiency and poor success. The first method adopts the parameter-fitting to a saw-tooth function of tried beat length by the criterion of minimum square deviations, without special limitation on the cut length. The second method adopts linear-fitting in the divided length ranges, only restrict condition is the increment between different cut lengths less than one beat-length. For a section of holey high-birefringence fiber, we do experiments respectively by the two methods. The detecting error of beat-length is discussed and the advantage is compared.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhi-Dong Shi, Zhi-Dong Shi, Jian-Qiang Lin, Jian-Qiang Lin, Huan-Huan Bao, Huan-Huan Bao, Shu Liu, Shu Liu, Xue-Nong Xiang, Xue-Nong Xiang, } "Improved cutback method measuring beat-length for high-birefringence optical fiber by fitting data of photoelectric signal", Proc. SPIE 6622, International Symposium on Photoelectronic Detection and Imaging 2007: Laser, Ultraviolet, and Terahertz Technology, 662216 (22 February 2008); doi: 10.1117/12.790822; https://doi.org/10.1117/12.790822
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