Study and application of corner detecting and locating on color aberration analysis of tiles

Yanwen Li; Genfeng Bi; Xinyan Huang; Longjiang Zheng

doi:10.1117/12.791501

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5 March 2008 Study and application of corner detecting and locating on color aberration analysis of tiles

Yanwen Li; Genfeng Bi; Xinyan Huang; Longjiang Zheng

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Proceedings Volume 6623, International Symposium on Photoelectronic Detection and Imaging 2007: Image Processing; 66231B (2008) https://doi.org/10.1117/12.791501
Event: International Symposium on Photoelectronic Detection and Imaging: Technology and Applications 2007, 2007, Beijing, China

Abstract

This paper base on online detecting and position-setting of tiles and introduce two methods of corner detecting. The methods are MIC corner to withdraw the operator and Harris corner to withdraw the operator. It compares the characters of the two algorithms and uses Harris corner extraction operator to offer on-line detection and localization of tiles. It also analyses and divides the image detection window and offers important method for extracting and analyzing of color character of image.

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Yanwen Li, Genfeng Bi, Xinyan Huang, and Longjiang Zheng "Study and application of corner detecting and locating on color aberration analysis of tiles", Proc. SPIE 6623, International Symposium on Photoelectronic Detection and Imaging 2007: Image Processing, 66231B (5 March 2008); https://doi.org/10.1117/12.791501

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KEYWORDS

Corner detection

Edge detection

Image analysis

Image processing

Detection and tracking algorithms

Ceramics

Computer vision technology

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