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12 March 2008 Testing the large aperture optical components by the sub-aperture stitching interferometer
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Proceedings Volume 6624, International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing; 66240D (2008) https://doi.org/10.1117/12.791064
Event: International Symposium on Photoelectronic Detection and Imaging: Technology and Applications 2007, 2007, Beijing, China
Abstract
Nowadays many large aperture optical components are widely used in the high-tech area, how to test them become more and more important. Here describes a new method to test the large aperture optical components using the small aperture interferometer, deduce how to get the aperture number and the concrete process of the stitching parameter in a systematic way, finally get the best plan to choose the sub-aperture of the square and circular optical plane. To specify the stability of the method we operate an experiment, the result shows that the stitching accuracy can reach λ/10, it meet the need of the inertia constraint fusion etc, that is good enough to be used in the high-tech area.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yong He, Zhao-xuan Wang, Qing Wang, and Bo Ji "Testing the large aperture optical components by the sub-aperture stitching interferometer", Proc. SPIE 6624, International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing, 66240D (12 March 2008); https://doi.org/10.1117/12.791064
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