19 February 2008 Contour extracting with combination particle filtering and EM algorithm
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Proceedings Volume 6625, International Symposium on Photoelectronic Detection and Imaging 2007: Related Technologies and Applications; 66250R (2008) https://doi.org/10.1117/12.790850
Event: International Symposium on Photoelectronic Detection and Imaging: Technology and Applications 2007, 2007, Beijing, China
Abstract
The problem of extracting continuous structures from images is a difficult issue in early pattern recognition and image processing. Tracking with contours in a filtering framework requires a dynamical model for prediction. Recently, Particle filter, is widely used because its multiple hypotheses and versatility within framework. However, the good choice of the propagation function is still its main problem. In this paper, an improved particle filter, EM-PF algorithm is proposed which using the EM (Expectation-Maximization) algorithm to learn the dynamical models. The EM algorithm can explicitly learn the parameters of the dynamical models from training sequences. The advantage of using the EM algorithm in particle filter is that it is capable of improve tracking contour by having accurate model parameters. Though the experiment results, we show how our EM-PF can be applied to produces more robust and accurate extracting.
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Bo Meng, Bo Meng, Ming Zhu, Ming Zhu, } "Contour extracting with combination particle filtering and EM algorithm", Proc. SPIE 6625, International Symposium on Photoelectronic Detection and Imaging 2007: Related Technologies and Applications, 66250R (19 February 2008); doi: 10.1117/12.790850; https://doi.org/10.1117/12.790850
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