2 May 2007 Properties of X-ray Cherenkov radiation produced by charged particles in Si/Mo multilayers
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Proceedings Volume 6634, International Conference on Charged and Neutral Particles Channeling Phenomena II; 663414 (2007) https://doi.org/10.1117/12.741931
Event: International Conference on Charged and Neutral Particles Channeling Phenomena II, 2006, Rome, Italy
Abstract
The angular-spectral distributions as well as the dependence of the total number of photons of X-ray Cherenkov radiation upon the number, thickness of the layers and on particle energy have been calculated using the theoretical formulae taking into account the reflection from the interfaces between the two media of the Si/Mo multilayers. The possibilities of the experimental investigation have been discussed.
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M. A. Aginian, M. A. Aginian, L. A. Gevorgian, L. A. Gevorgian, K. A. Ispirian, K. A. Ispirian, M. K. Ispiryan, M. K. Ispiryan, } "Properties of X-ray Cherenkov radiation produced by charged particles in Si/Mo multilayers", Proc. SPIE 6634, International Conference on Charged and Neutral Particles Channeling Phenomena II, 663414 (2 May 2007); doi: 10.1117/12.741931; https://doi.org/10.1117/12.741931
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