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7 May 2007 Enhancements of the Abelés method for refractive index determination
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Proceedings Volume 6635, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies III; 663507 (2007) https://doi.org/10.1117/12.741865
Event: Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies III, 2006, Bucharest, Romania
Abstract
The Abelès method is a classical method for determining the refractive index of dielectric thin films, based on the phenomenon oftotal transmission of p-polarized light at the Brewster angle ofincidence. In this paper we examined the main features of the method, such as the criterion for ruling out spurious solutions, in a formal manner, using closed form equations. We also investigated the method for ambiguities and we found out using rigorous analysis that the method is ambiguous, because there are unreported situations in which the spurious solutions cannot be distinguished from the real solution. The limits within which the method can be used, even in situations when ambiguities exist, are determined.
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Petre C. Logofatu, Iuliana M. Iordache, and Mihaela M. Bojan "Enhancements of the Abelés method for refractive index determination", Proc. SPIE 6635, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies III, 663507 (7 May 2007); https://doi.org/10.1117/12.741865
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