8 May 2007 Interference diagnostics large-scale surfaces
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Proceedings Volume 6635, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies III; 66350T (2007) https://doi.org/10.1117/12.741921
Event: Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies III, 2006, Bucharest, Romania
Abstract
The feasibilities for optical correlation diagnostics of a rough surface with large surface inhjmogeneities by determining the transformations of the longitudinal coherence function of the field scattered by such surface are substantiated and implemented.
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O. V. Angelsky, O. V. Angelsky, O. P. Maksimyak, O. P. Maksimyak, P. P. Maksimyak, P. P. Maksimyak, } "Interference diagnostics large-scale surfaces", Proc. SPIE 6635, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies III, 66350T (8 May 2007); doi: 10.1117/12.741921; https://doi.org/10.1117/12.741921
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