Nanostructured SnO2-SiO2 glassceramic thin films as electroluminescent material: an impedance spectroscopy analysis

Alberto Paleari; Norberto Chiodini; Marco Giussani; Alessandro Lauria; Roberto Lorenzi

doi:10.1117/12.732449

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17 September 2007 Nanostructured SnO₂-SiO₂ glassceramic thin films as electroluminescent material: an impedance spectroscopy analysis

Alberto Paleari, Norberto Chiodini, Marco Giussani, Alessandro Lauria, Roberto Lorenzi

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Proceedings Volume 6639, Nanophotonic Materials IV; 66390L (2007) https://doi.org/10.1117/12.732449
Event: NanoScience + Engineering, 2007, San Diego, California, United States

Abstract

Optically transparent nanostructured SiO₂ glassceramics containing a high density of monodispersed nanometer-sized clusters of semiconducting SnO₂ have been obtained by phase separation from a sol-gel derived synthesis. Complex impedance spectroscopy analysis has been performed to get information about the conduction mechanisms to understand the electrical behavior of the material. Measurements have been taken with applied bias ranging from +40 V to -40 V and with an alternated voltage signal in the range 20 Hz - 1 MHz and amplitude from 10 mV to 300 mV. An equivalent circuit, based on a metal-oxide-semiconductor model, comprising nanostructuring contributions, allows measurements fitting. Capacity-voltage and conductance-voltage curves have been obtained for each component.

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Alberto Paleari, Norberto Chiodini, Marco Giussani, Alessandro Lauria, and Roberto Lorenzi "Nanostructured SnO₂-SiO₂ glassceramic thin films as electroluminescent material: an impedance spectroscopy analysis", Proc. SPIE 6639, Nanophotonic Materials IV, 66390L (17 September 2007); https://doi.org/10.1117/12.732449

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