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Integration, interoperability, and information management: What are the key issues for nanomanufacturing?
Modelling of angle-resolved x-ray photoelectron spectroscopy (ARXPS) intensity ratios for nanocharacterisation of closely packed shell-core nanofibres
Computational modeling of laser-induced self-organization in nanoscopic metal films for predictive nanomanufacturing
A novel low-cost high-throughput probe card scanner analyzer for characterization of magnetic tunnel junctions
Measurements of linear sizes of relief elements in the nanometer range using an atomic force microscope
Measurements of linear sizes of relief elements in the nanometer range using a scanning electron microscope