Calculation of MRF influence functions

Markus Schinhaerl; Gordon Smith; Andreas Geiss; Lyndon Smith; Rolf Rascher; Peter Sperber; Elmar Pitschke; Richard Stamp

doi:10.1117/12.730806

14 September 2007 Calculation of MRF influence functions

Markus Schinhaerl, Gordon Smith, Andreas Geiss, Lyndon Smith, Rolf Rascher, Peter Sperber, Elmar Pitschke, Richard Stamp

Author Affiliations +

Proceedings Volume 6671, Optical Manufacturing and Testing VII; 66710Y (2007) https://doi.org/10.1117/12.730806
Event: Optical Engineering + Applications, 2007, San Diego, California, United States

Abstract

Magnetorheological finishing (MRF) is a commonly used computer-controlled polishing (CCP) technique for high precision optical surfaces. The process is based on a magnetorheological abrasive fluid, which stiffens in a magnetic field and may be employed as a sub-aperture polishing tool. Dependent upon the surface error-profile of the workpiece and the polishing tool characteristic (influence function) an individual polishing procedure is calculated prior to processing. However, determination of the influence function remains a time consuming and laborious task. A user friendly and easy to use software tool has been developed, which enables rapid computation of MRF influence functions dependent on the MRF specific parameters, such as, magnetic field strength or fluid viscosity. The software supersedes the current cumbersome and time consuming determination procedure and thus results in considerably improved and more economical manufacture. In comparison with the conventional time period of typically 20 minutes to ascertain an influence function, it may now be calculated in a few seconds. An average quality improvement of 57% relating to the peak-valley (PV) value, and approximately 66% relating to the root-mean-square (RMS) of the surface error-profiles was observed during employment of the artificial computed influence functions for polishing.

Citation Download Citation

Markus Schinhaerl, Gordon Smith, Andreas Geiss, Lyndon Smith, Rolf Rascher, Peter Sperber, Elmar Pitschke, and Richard Stamp "Calculation of MRF influence functions", Proc. SPIE 6671, Optical Manufacturing and Testing VII, 66710Y (14 September 2007); https://doi.org/10.1117/12.730806

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