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Simultaneous measurements of thin-film thickness and refractive index by dispersive white-light interferometry
Conductive distributed Bragg reflector fabricated by oblique angle deposition from a single material
Robust antireflection coatings By UV cross-linking of silica nanoparticles and diazo-resin polycation
ZnO based diluted magnetic semiconductor thin films by RF magnetron sputtering for spin photonic devices