Characterizing dielectric tensors from angle-of-incidence Mueller matrix images

Paula K. Smith; Russell A. Chipman

doi:10.1117/12.735335

13 September 2007 Characterizing dielectric tensors from angle-of-incidence Mueller matrix images

Paula K. Smith, Russell A. Chipman

Proceedings Volume 6682, Polarization Science and Remote Sensing III; 66820N (2007) https://doi.org/10.1117/12.735335
Event: Optical Engineering + Applications, 2007, San Diego, California, United States

Abstract

Biaxial ellipsometry is a technique that measures the dielectric tensor and thickness of a biaxial substrate, single-layer thin film, or multi-layer structure. The dielectric tensor of a biaxial material consists of the real and imaginary parts of the three orthogonal principal indices (n_x+ ik_x, n_y+ ik_y and n_z + ik_z) and three Euler angles (Θ, Φ, Δ) to describe its orientation. The method utilized in this work measures an angle-of-incidence Mueller matrix from a Mueller matrix imaging polarimeter equipped with a pair of microscope objectives with low polarization aberrations. The dielectric tensors for multilayer samples are determined from multi-spectral angle-of-incidence Mueller matrix images in either a transmission or reflection mode using an appropriate dispersion model. Given approximate a priori knowledge of the dielectric tensor and film thickness, a Jones matrix image is first calculated by solving Maxwell's equations at each surface which is then transformed into a Mueller matrix image. An optimization algorithm then finds the best fit dielectric tensor based on matching the measured and calculated angle-of-incidence Mueller matrix images. One use for this application is to more accurately determine the dielectric tensors of biaxial films used in liquid crystal displays.

Citation Download Citation

Paula K. Smith and Russell A. Chipman "Characterizing dielectric tensors from angle-of-incidence Mueller matrix images", Proc. SPIE 6682, Polarization Science and Remote Sensing III, 66820N (13 September 2007); https://doi.org/10.1117/12.735335

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available