Paper
13 September 2007 The in-flight spectroscopic performance of the Swift XRT CCD camera during 2006-2007
O. Godet, A. P. Beardmore, A. F. Abbey, J. P. Osborne, K. L. Page, L. Tyler, D. N. Burrows, P. Evans, R. Starling, A. A. Wells, L. Angelini, S. Campana, G. Chincarini, O. Citterio, G. Cusamano, P. Giommi, J. E. Hill, J. Kennea, V. LaParola, V. Mangano, T. Mineo, A. Moretti, J. A. Nousek, C. Pagani, M. Perri, M. Capalbi, P. Romano, G. Tagliaferri, F. Tamburelli
Author Affiliations +
Abstract
The Swift X-ray Telescope focal plane camera is a front-illuminated MOS CCD, providing a spectral response kernel of 135 eV FWHM at 5.9 keV as measured before launch. We describe the CCD calibration program based on celestial and on-board calibration sources, relevant in-flight experiences, and developments in the CCD response model. We illustrate how the revised response model describes the calibration sources well. Comparison of observed spectra with models folded through the instrument response produces negative residuals around and below the Oxygen edge. We discuss several possible causes for such residuals. Traps created by proton damage on the CCD increase the charge transfer inefficiency (CTI) over time. We describe the evolution of the CTI since the launch and its effect on the CCD spectral resolution and the gain.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
O. Godet, A. P. Beardmore, A. F. Abbey, J. P. Osborne, K. L. Page, L. Tyler, D. N. Burrows, P. Evans, R. Starling, A. A. Wells, L. Angelini, S. Campana, G. Chincarini, O. Citterio, G. Cusamano, P. Giommi, J. E. Hill, J. Kennea, V. LaParola, V. Mangano, T. Mineo, A. Moretti, J. A. Nousek, C. Pagani, M. Perri, M. Capalbi, P. Romano, G. Tagliaferri, and F. Tamburelli "The in-flight spectroscopic performance of the Swift XRT CCD camera during 2006-2007", Proc. SPIE 6686, UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XV, 66860A (13 September 2007); https://doi.org/10.1117/12.734180
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Cited by 5 scholarly publications.
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KEYWORDS
Charge-coupled devices

Calibration

X-rays

Signal to noise ratio

Calcium

CCD cameras

Silicon

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