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13 September 2007 Narrow-band x-ray polarizing filters
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Abstract
We review past and current attempts to measure X-ray polarization in celestial sources and describe research activity into a new family of materials which have been shown to exhibit linear dichroism at X-ray wavelengths. Such materials could add a polarimetry capability to the high energy resolution detectors proposed for future, high effective area, X-ray astrophysical observatories such as Constellation-X and XEUS. They have the potential to achieve useful minimum detectable polarization values for a number of sources in a sensible exposure time with XEUS.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. Martindale, N. P. Bannister, K. D. M. Harris, G. A. Solan, S. P. Collins, Y. Champouret, V. K. Muppidi, G. W. Fraser, and M. Roy "Narrow-band x-ray polarizing filters", Proc. SPIE 6686, UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XV, 66860X (13 September 2007); https://doi.org/10.1117/12.734114
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