Paper
20 September 2007 Simbol-X: x-ray baffle for stray-light reduction
Author Affiliations +
Abstract
Simbol-X, an hard X-ray mission proposed by a consortium of European laboratories, will operate on a broad energy range (0.570 keV) providing a large collecting area ( ~ 1500 cm2 at 1.5 keV and ~ 450 cm2 at 30 keV) and a good imaging capability over the entire energy range. Relying on two spacecrafts in a formation flight configuration, Simbol-X will use, for the first time, a 20 meters focal length X-ray concentrator with multilayers coated mirrors that efficiently focalize photons above 10 keV and enhance the sensitivity up to 70 keV. Thanks to a ray-tracing code, we simulated the Simbol-X optics performance and investigated the contamination at the focal plane caused by stray−light from diffuse cosmic X-ray background. A dedicated X-ray baffle is mandatory to minimize this contamination that otherwise, would strongly affect the telescope sensitivity. In this paper we investigate different X-ray baffle designs and show their efficiency in reducing the stray−light.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
G. Cusumano, M. A. Artale, T. Mineo, V. Teresi, G. Pareschi, and V. Cotroneo "Simbol-X: x-ray baffle for stray-light reduction", Proc. SPIE 6688, Optics for EUV, X-Ray, and Gamma-Ray Astronomy III, 66880C (20 September 2007); https://doi.org/10.1117/12.732304
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Cited by 4 scholarly publications.
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KEYWORDS
X-rays

Mirrors

Stray light

X-ray telescopes

Contamination

Telescopes

Sensors

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