20 September 2007 Grazing incidence reflection and scattering of MeV protons
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Abstract
Treating protons as de Broglie waves shows that up to a few MeV energies protons experience total external reflection using the index of refraction concept for the target earlier applied to electrons. Angular distributions can be explained by random surface scattering as known for X-rays. Applied ot the Chandra and XMM-Newton X-ray telescopes the calculated reflection efficiencies can explain the observed degradation of the X-ray CCDs for both missions. Some discussion about the possibility of realizing imaging sub-MeV proton optics is presented.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bernd Aschenbach, "Grazing incidence reflection and scattering of MeV protons", Proc. SPIE 6688, Optics for EUV, X-Ray, and Gamma-Ray Astronomy III, 66880I (20 September 2007); doi: 10.1117/12.735589; https://doi.org/10.1117/12.735589
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