3 October 2007 Toward a complete metrologic solution for the mirrors for the Constellation-X Spectroscopy x-ray telescope
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Abstract
We present an overview update of the metrologic approach to be employed for the segmented mirror fabrication for Constellation-X spectroscopy x-ray telescope. We compare results achieved to date with mission requirements. This is discussed in terms of inherent capability versus in-practice capability. We find that all the needed metrics for the mirrors are in hand but that they are currently limited by the mounting of the mirrors themselves.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. P. Lehan, J. P. Lehan, S. Owens, S. Owens, T. Hadjimichael, T. Hadjimichael, M. Hong, M. Hong, K.-W. Chan, K.-W. Chan, T. T. Saha, T. T. Saha, P. Reid, P. Reid, W. W. Zhang, W. W. Zhang, } "Toward a complete metrologic solution for the mirrors for the Constellation-X Spectroscopy x-ray telescope", Proc. SPIE 6688, Optics for EUV, X-Ray, and Gamma-Ray Astronomy III, 668818 (3 October 2007); doi: 10.1117/12.733080; https://doi.org/10.1117/12.733080
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