19 September 2007 SIM PlanetQuest precision white light interferometry
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Precision white light interferometry performed at the picometer class level is an extremely challenging endeavor. Over the past several years a combination of analysis, experiment, and reconciliation of the two has yielded continued improvements and refinements of the process to bring this technology to fruition. This paper provides an overview of several of the refinements of the interference models and algorithms developed for calibration and fringe estimation that have evolved over this period.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mark H. Milman, Mark H. Milman, Martin Regehr, Martin Regehr, Chengxing Zhai, Chengxing Zhai, } "SIM PlanetQuest precision white light interferometry", Proc. SPIE 6693, Techniques and Instrumentation for Detection of Exoplanets III, 66930E (19 September 2007); doi: 10.1117/12.732530; https://doi.org/10.1117/12.732530

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