17 September 2007 PbTe thin films grown by femtosecond pulsed laser deposition
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PbTe thin films were grown on BK7 glass and Si(100) substrates using femtosecond pulsed laser deposition at room temperature. The influence of the background pressure and the laser fluence on the structural and optical characteristics of the PbTe films was studied. Scanning electron microscopy (SEM) and X-ray diffraction (XRD) were used to characterize the surface and structural properties of the deposited PbTe thin films, respectively. Transmission spectroscopy measurements in the visible and infrared region (VIS-IR) were used to investigate the optical properties of the PbTe thin films.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
E. Rodriguez, E. Rodriguez, D. Silva, D. Silva, Lourdes Moya, Lourdes Moya, C. L. Cesar, C. L. Cesar, L. C. Barbosa, L. C. Barbosa, A. Schrank, A. Schrank, C. R. Souza Filho, C. R. Souza Filho, E. P. de Oliveira, E. P. de Oliveira, } "PbTe thin films grown by femtosecond pulsed laser deposition", Proc. SPIE 6698, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications, 669809 (17 September 2007); doi: 10.1117/12.738871; https://doi.org/10.1117/12.738871

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