Paper
21 September 2007 Spectral unmixing of agents on surfaces for the Joint Contaminated Surface Detector (JCSD)
Author Affiliations +
Abstract
ITT Corporation, Advanced Engineering and Sciences Division, is currently developing the Joint Contaminated Surface Detector (JCSD) technology under an Advanced Concept Technology Demonstration (ACTD) managed jointly by the U.S. Army Research, Development, and Engineering Command (RDECOM) and the Joint Project Manager for Nuclear, Biological, and Chemical Contamination Avoidance for incorporation on the Army's future reconnaissance vehicles. This paper describes the design of the chemical agent identification (ID) algorithm associated with JCSD. The algorithm detects target chemicals mixed with surface and interferent signatures. Simulated data sets were generated from real instrument measurements to support a matrix of parameters based on a Design Of Experiments approach (DOE). Decisions based on receiver operating characteristics (ROC) curves and area-under-the-curve (AUC) measures were used to down-select between several ID algorithms. Results from top performing algorithms were then combined via a fusion approach to converge towards optimum rates of detections and false alarms. This paper describes the process associated with the algorithm design and provides an illustrating example.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mohamed-Adel Slamani, Thomas H. Chyba, Howard LaValley, and Darren Emge "Spectral unmixing of agents on surfaces for the Joint Contaminated Surface Detector (JCSD)", Proc. SPIE 6699, Signal and Data Processing of Small Targets 2007, 66991B (21 September 2007); https://doi.org/10.1117/12.731496
Lens.org Logo
CITATIONS
Cited by 7 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Detection and tracking algorithms

Diffractive optical elements

Nanoimprint lithography

Chemical analysis

Sensors

Laser scattering

Target detection

Back to Top