12 October 2007 Neutral nanocluster chemistry studied by soft x-ray laser single-photon ionization: application to soft x-ray optical surface contamination studies: SimOn and TimOn
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Proceedings Volume 6702, Soft X-Ray Lasers and Applications VII; 67020K (2007); doi: 10.1117/12.731911
Event: Optical Engineering + Applications, 2007, San Diego, California, United States
Abstract
Metal oxide clusters are employed in studies to help understand an important, specific, type of surface chemical problem: the contamination of soft x-ray mirrors by carbon deposits. Herein we report nanocluster chemistry studies that are relevant to the use of silicon oxide and titanium oxide capping layers. Systems involving SimOn, and TimOn metal oxide nanoclusters are generated in a pulsed supersonic expansion/ablation source and passed through a reactor containing any reactant desired. The reaction products of these gas phase clusters are ionized using single photon ionization from a desk-top sized 46.9 nm Ne-like Ar laser providing the advantage of little or no fragmentation of desired nanoclusters. The ionized products are analyzed by a time of flight mass spectrometer and experimental results supply useful information related to condensed phase soft x-ray optical surfaces. The results illustrate the great potential of the use of very compact soft x-ray lasers in photochemistry and photophysics studies.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S. Heinbuch, F. Dong, J. J. Rocca, E. R. Bernstein, "Neutral nanocluster chemistry studied by soft x-ray laser single-photon ionization: application to soft x-ray optical surface contamination studies: SimOn and TimOn", Proc. SPIE 6702, Soft X-Ray Lasers and Applications VII, 67020K (12 October 2007); doi: 10.1117/12.731911; https://doi.org/10.1117/12.731911
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KEYWORDS
Silicon

Oxides

Titanium

Ionization

X-rays

X-ray optics

Mirrors

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