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Microstitching interferometer and relative angle determinable stitching interferometer for half-meter-long x-ray mirror
A microstitching interferometer for evaluating the surface profile of precisely figured x-ray K-B mirrors
Binary pseudo-random grating as a standard test surface for measurement of modulation transfer function of interferometric microscopes
Second metrology round-robin of APS, ESRF and SPring-8 laboratories of elliptical and spherical hard-x-ray mirrors
Comparison of slope and height profiles for flat synchrotron x-ray mirrors measured with a long trace profiler and a PMI Fizeau interferometer
Surface gradient integrated profiler for x-ray and EUV optics: self calibration method of measured position for an off-axis parabolic mirror (f=150mm) measurement