High order harmonics wavefront measurement and optimization

J. Gautier; A. S. Morlens; P. Zeitoun; E. Papalarazou; G. Rey; C. Valentin; J. P. Goddet; S. Sebban; Guillaume Dovillaire; Xavier Levecq; Samuel Bucourt

doi:10.1117/12.732339

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1 October 2007 High order harmonics wavefront measurement and optimization

J. Gautier; A. S. Morlens; P. Zeitoun; E. Papalarazou; G. Rey; C. Valentin; J. P. Goddet; S. Sebban; Guillaume Dovillaire; Xavier Levecq; Samuel Bucourt

Author Affiliations +

Proceedings Volume 6704, Advances in Metrology for X-Ray and EUV Optics II; 670403 (2007) https://doi.org/10.1117/12.732339
Event: Optical Engineering + Applications, 2007, San Diego, California, United States

Abstract

We present a full optimization of the high harmonics wave-front thanks to the use of a soft x-ray Hartmann sensor. The sensor was calibrated using high harmonics source with a λ/50 accuracy. We observed relatively good high harmonics wave-front, two times the diffraction-limit, with astigmatism as the dominant aberration for any interaction parameters. By slightly clipping the unfocused beam, it is possible to produce a diffraction-limited beam containing about 90% of the incident energy. The influence of high harmonic generation parameters was also studied in particularly the influence of the infra-red wave-front. In particular we studied the correlation between the infrared wave-front use to create high harmonics and the high harmonic wave-front. We also report wave-front measurements of a high order harmonic beam into an x-ray laser plasma amplifier at 32.8 nm.

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J. Gautier, A. S. Morlens, P. Zeitoun, E. Papalarazou, G. Rey, C. Valentin, J. P. Goddet, S. Sebban, Guillaume Dovillaire, Xavier Levecq, and Samuel Bucourt "High order harmonics wavefront measurement and optimization", Proc. SPIE 6704, Advances in Metrology for X-Ray and EUV Optics II, 670403 (1 October 2007); https://doi.org/10.1117/12.732339

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