High order harmonics wavefront measurement and optimization

J. Gautier; A. S. Morlens; P. Zeitoun; E. Papalarazou; G. Rey; C. Valentin; J. P. Goddet; S. Sebban; Guillaume Dovillaire; Xavier Levecq; Samuel Bucourt

doi:10.1117/12.732339

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1 October 2007 High order harmonics wavefront measurement and optimization

J. Gautier, A. S. Morlens, P. Zeitoun, E. Papalarazou, G. Rey, C. Valentin, J. P. Goddet, S. Sebban, Guillaume Dovillaire, Xavier Levecq, Samuel Bucourt

Author Affiliations +

Proceedings Volume 6704, Advances in Metrology for X-Ray and EUV Optics II; 670403 (2007) https://doi.org/10.1117/12.732339
Event: Optical Engineering + Applications, 2007, San Diego, California, United States

Abstract

We present a full optimization of the high harmonics wave-front thanks to the use of a soft x-ray Hartmann sensor. The sensor was calibrated using high harmonics source with a λ/50 accuracy. We observed relatively good high harmonics wave-front, two times the diffraction-limit, with astigmatism as the dominant aberration for any interaction parameters. By slightly clipping the unfocused beam, it is possible to produce a diffraction-limited beam containing about 90% of the incident energy. The influence of high harmonic generation parameters was also studied in particularly the influence of the infra-red wave-front. In particular we studied the correlation between the infrared wave-front use to create high harmonics and the high harmonic wave-front. We also report wave-front measurements of a high order harmonic beam into an x-ray laser plasma amplifier at 32.8 nm.

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J. Gautier, A. S. Morlens, P. Zeitoun, E. Papalarazou, G. Rey, C. Valentin, J. P. Goddet, S. Sebban, Guillaume Dovillaire, Xavier Levecq, and Samuel Bucourt "High order harmonics wavefront measurement and optimization", Proc. SPIE 6704, Advances in Metrology for X-Ray and EUV Optics II, 670403 (1 October 2007); https://doi.org/10.1117/12.732339

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