20 September 2007 Metrology of micromirrors with replicated multilayers
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Replicated multilayers inside the rotationally symmetric x-ray mirrors with diameter 0.5-4 mm are being investigated. While the replicated Micromirror technology as well as replicated multilayers on the planar surface were already studied, we present here the combination of both technologies. Initial simulations and development of metrology of multilayers inside small cavities are described, as well as very first results of experiments.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
L. Sveda, L. Sveda, A. Inneman, A. Inneman, V. Semencova, V. Semencova, L. Pina, L. Pina, R. Hudec, R. Hudec, R. Havlikova, R. Havlikova, } "Metrology of micromirrors with replicated multilayers", Proc. SPIE 6705, Advances in X-Ray/EUV Optics and Components II, 67050D (20 September 2007); doi: 10.1117/12.733936; https://doi.org/10.1117/12.733936


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