Hard x-ray focusing by stacked Fresnel zone plates

Irina Snigireva; Anatoly Snigirev; Viktor Kohn; Vyacheslav Yunkin; Maxim Grigoriev; Serguei Kuznetsov; Gavin Vaughan; Marco Di Michiel

doi:10.1117/12.732404

20 September 2007 Hard x-ray focusing by stacked Fresnel zone plates

Irina Snigireva, Anatoly Snigirev, Viktor Kohn, Vyacheslav Yunkin, Maxim Grigoriev, Serguei Kuznetsov, Gavin Vaughan, Marco Di Michiel

Author Affiliations +

Proceedings Volume 6705, Advances in X-Ray/EUV Optics and Components II; 67050G (2007) https://doi.org/10.1117/12.732404
Event: Optical Engineering + Applications, 2007, San Diego, California, United States

Abstract

Stacking technique was developed in order to increase focusing efficiency of Fresnel zone plates at high energies. Two identical Si chips each of which containing Fresnel zone plates were used for stacking. Alignment of the chips was achieved by on-line observation of the moiré pattern from the two zone plates. The formation of moiré patterns was studied theoretically and experimentally at different experimental conditions. To provide the desired stability Si-chips with zone plates were bonded together with slow solidification speed epoxy glue. Technique of angular alignment in order to compensate a linear displacement in the process of gluing was proposed. Two sets of stacked FZPs were produced and experimentally tested to focus 15 and 50 keV X-rays. Gain in the efficiency by factor 2.5 was demonstrated at 15 keV. Focal spot of 1.8 μm vertically and 14 μm horizontally with 35% efficiency was measured at 50 keV. Forecast for the stacking of nanofocusing Fresnel zone plates was discussed.

Citation Download Citation

Irina Snigireva, Anatoly Snigirev, Viktor Kohn, Vyacheslav Yunkin, Maxim Grigoriev, Serguei Kuznetsov, Gavin Vaughan, and Marco Di Michiel "Hard x-ray focusing by stacked Fresnel zone plates", Proc. SPIE 6705, Advances in X-Ray/EUV Optics and Components II, 67050G (20 September 2007); https://doi.org/10.1117/12.732404

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