Differential aperture x-ray microscopy near Te precipitates in CdZnTe

E. A. Miller; M. Toloczko; C. E. Seifert; A. Seifert; W. Liu; M. Bliss

doi:10.1117/12.738959

21 September 2007 Differential aperture x-ray microscopy near Te precipitates in CdZnTe

E. A. Miller, M. Toloczko, C. E. Seifert, A. Seifert, W. Liu, M. Bliss

Proceedings Volume 6706, Hard X-Ray and Gamma-Ray Detector Physics IX; 670609 (2007) https://doi.org/10.1117/12.738959
Event: Optical Engineering + Applications, 2007, San Diego, California, United States

Abstract

We report the results of Differential Aperture X-ray Microscopy (DAXM) measurements near Te precipitates in CdZnTe grown via low-pressure Bridgman. White-beam Laue patterns were acquired with 3-D spatial resolution (with 0.25 μm resolution in the scanning directions and 1 μm resolution in depth) at depths of up to 35 μm deep normal to the surface. We find very little crystal strain (< 10^-3) or rotation (<0.05 degrees) near Te precipitates. We also examine local deformations in the vicinity of a microhardness indent, and find that although significant rotations exist, the spatial extent is limited to a few tens of microns. Furthermore, observed crystal strains are limited to 5 x 10^-3 or less in regions near the microhardness indent.

Citation Download Citation

E. A. Miller, M. Toloczko, C. E. Seifert, A. Seifert, W. Liu, and M. Bliss "Differential aperture x-ray microscopy near Te precipitates in CdZnTe", Proc. SPIE 6706, Hard X-Ray and Gamma-Ray Detector Physics IX, 670609 (21 September 2007); https://doi.org/10.1117/12.738959

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