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21 September 2007 Differential aperture x-ray microscopy near Te precipitates in CdZnTe
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We report the results of Differential Aperture X-ray Microscopy (DAXM) measurements near Te precipitates in CdZnTe grown via low-pressure Bridgman. White-beam Laue patterns were acquired with 3-D spatial resolution (with 0.25 μm resolution in the scanning directions and 1 μm resolution in depth) at depths of up to 35 μm deep normal to the surface. We find very little crystal strain (< 10-3) or rotation (<0.05 degrees) near Te precipitates. We also examine local deformations in the vicinity of a microhardness indent, and find that although significant rotations exist, the spatial extent is limited to a few tens of microns. Furthermore, observed crystal strains are limited to 5 x 10-3 or less in regions near the microhardness indent.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
E. A. Miller, M. Toloczko, C. E. Seifert, A. Seifert, W. Liu, and M. Bliss "Differential aperture x-ray microscopy near Te precipitates in CdZnTe", Proc. SPIE 6706, Hard X-Ray and Gamma-Ray Detector Physics IX, 670609 (21 September 2007);


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