24 September 2007 Investigation of TlBr detector response under high-flux x-rays
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Proceedings Volume 6706, Hard X-Ray and Gamma-Ray Detector Physics IX; 67061F (2007); doi: 10.1117/12.734779
Event: Optical Engineering + Applications, 2007, San Diego, California, United States
Abstract
Thallium bromide (TlBr) is a compound semiconductor with high density, high atomic numbers and wide bandgap. In addition, recent results indicate that the mobility-lifetime product of electrons can be quite high, approaching the values for CdTe and CZT. These properties make TlBr a very promising material for nuclear radiation detector at room temperature. In this paper we report on our investigation of the performance of planar TlBr detector under high flux x-rays irradiation. This study proposes an alternate contact method that reduces the polarization effects, and the afterglow for a wide range of high flux applications.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hadong Kim, Leonard Cirignano, Yuri Dmitriev, Mike Squillante, Philip Wong, Kanai Shah, "Investigation of TlBr detector response under high-flux x-rays", Proc. SPIE 6706, Hard X-Ray and Gamma-Ray Detector Physics IX, 67061F (24 September 2007); doi: 10.1117/12.734779; https://doi.org/10.1117/12.734779
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KEYWORDS
Sensors

X-rays

Polarization

X-ray detectors

Signal detection

Crystals

Electrons

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