10 October 2007 Temperature stress effects on optical nonlinear waveguide sensor
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Proceedings Volume 6716, Optomechatronic Sensors and Instrumentation III; 67160B (2007) https://doi.org/10.1117/12.754182
Event: International Symposium on Optomechatronic Technologies, 2007, Lausanne, Switzerland
A theoretical approach to study the influence of temperature stress of the thermal sensitivity effective refractive index for asymmetrical nonlinear optical waveguides is developed. In the proposed waveguide structure, temperature stress is induced due to the different thermal expansion coefficients of the substrate, core and cladding. Numerical calculation is carried out to draw the thermal sensitivities of effective refractive indices against the core thickness for both transverse electric modes (TE) and transverse magnetic modes (TM). The relation between thermal sensitivities and different temperature stress gradient is derived and plotted. Based on the results, thermal sensitivity of the sensor can be controlled by temperature stresses which can be controlled by carefully picking the materials and loading methods.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hala J. El-Khozondar, Rifa J. El-Khozondar, Mohammed M. Shabat, "Temperature stress effects on optical nonlinear waveguide sensor", Proc. SPIE 6716, Optomechatronic Sensors and Instrumentation III, 67160B (10 October 2007); doi: 10.1117/12.754182; https://doi.org/10.1117/12.754182

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