20 December 2007 Comparison of Gaussian and top-hat beam profiles in LIDT testing
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Abstract
The ISO 11254 standard for LIDT tests suggests two possible spatial beam profiles for damage testing. Accordingly, an equal set of samples was tested with a Gaussian TEM00 as well as with a top-hat beam profile at different beam diameters. It was found that for the investigated HfO2/SiO2 high reflectors there was no threshold dependence on the beam diameter at 355nm. The damage threshold values measured with the Gaussian and the top-hat beam were in good correlation.
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L. Jensen, L. Jensen, M. Jupe, M. Jupe, K. Starke, K. Starke, D. Ristau, D. Ristau, W. Riede, W. Riede, P. Allenspacher, P. Allenspacher, "Comparison of Gaussian and top-hat beam profiles in LIDT testing", Proc. SPIE 6720, Laser-Induced Damage in Optical Materials: 2007, 672013 (20 December 2007); doi: 10.1117/12.752873; https://doi.org/10.1117/12.752873
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