Paper
14 November 2007 Design and fabrication of x-ray Kirkpatrick-Baez microscope for ICF
Baozhong Mu, Zhanshan Wang, Shengling Huang, Shengzhen Yi, Zhengxiang Shen
Author Affiliations +
Proceedings Volume 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies; 67220S (2007) https://doi.org/10.1117/12.782896
Event: 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 2007, Chengdu, China
Abstract
A hard x-ray (8 keV, line of Cu) Kirkpatrick-Baez (KB) microscope was designed for the diagnostics of inertial confinement fusion (ICF). Three main parts including optical design, fabrication of multilayers, and alignment method were discussed in this paper. According to the deduced equation of aberration in whole field, an optical system was designed, which gives attention to not only spatial resolution but also the collection efficiency. Tungsten (W) and boron carbide (B4C) were chosen as multilayer materials and the non-periodic multilayer with 40 layers was deposited. The measured reflectivity by XRD is better than 18% in the bandwidth range of about 0.3%. Super accurately alignment is another difficulty in the application of KB microscope. To meet the requirements of pointing and co-focusing, a binocular laser pointer which is flexible enough was designed. Finally, an 8keV x-ray tube was used as source in x-ray imaging experiment and images with magnification of 2× were obtained.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Baozhong Mu, Zhanshan Wang, Shengling Huang, Shengzhen Yi, and Zhengxiang Shen "Design and fabrication of x-ray Kirkpatrick-Baez microscope for ICF", Proc. SPIE 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 67220S (14 November 2007); https://doi.org/10.1117/12.782896
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Cited by 2 scholarly publications.
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KEYWORDS
Microscopes

Mirrors

X-rays

Reflectivity

X-ray imaging

Multilayers

Imaging systems

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