14 November 2007 Super-resolved imaging system with oversampling technology
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Proceedings Volume 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies; 672214 (2007) https://doi.org/10.1117/12.782950
Event: 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 2007, Chengdu, China
Abstract
It has been a significant issue in the imaging filed to provide the highest possible resolution of an electro-optical imaging system(E-O imaging system). CCD arrays are inherently undersampled and spatial frequency above Nyquist frequency is distorted so as to create ambiguity and Moire patterns for targets imaged by E-O system.. As to this drawback, a system-design project is introduced and discussed in the paper. It's well known that many image quality metrics are linked to MTF. However, CCDs don't satisfy MTF condition, namely, the shift-invariant property, so MTF synthesis can't appraise the whole system simply by the MTF product of the few sub-system ones in E-O imaging system. Then it is depicted how to solve this problem in the following. Finally the analyses and comparisons of the imaging performance parameters with and without super-resolved technologies are shown.
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Xin Zhang, Xin Zhang, Yanyan Liu, Yanyan Liu, Jian-ping Zhang, Jian-ping Zhang, Ling-jie Wang, Ling-jie Wang, } "Super-resolved imaging system with oversampling technology", Proc. SPIE 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 672214 (14 November 2007); doi: 10.1117/12.782950; https://doi.org/10.1117/12.782950
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