14 November 2007 Method for characterization and simulation of non-axisymmetric aspheric rough surface
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Proceedings Volume 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies; 672225 (2007) https://doi.org/10.1117/12.783126
Event: 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 2007, Chengdu, China
Abstract
This paper presents a method for characterization and simulation of the non-axisymmetric aspheric rough surface. With this characterization procedure, simulation of the rough surface is simplified by decomposing the rough surface into two parts, which are the non-axisymmetric aspheric surface and the only rough component without the ideal surface. Then each component of the divided surface is simulated individually. The rough surface exhibits self-affinity and the fractal number D can be associated with any profile and is scale-invariant, and then the rough surface component is simulated with the Weierstrass-Mandelbrot fractal function. An example for simulating a non-axisymmetric and aspheric rough surface is performed and the flexibility of this characterization method is also discussed.
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Y. F. Peng, Y. B. Guo, "Method for characterization and simulation of non-axisymmetric aspheric rough surface", Proc. SPIE 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 672225 (14 November 2007); doi: 10.1117/12.783126; https://doi.org/10.1117/12.783126
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