14 November 2007 Negative refraction phenomenon dependent on wave guide width
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Proceedings Volume 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies; 67222Z (2007) https://doi.org/10.1117/12.783351
Event: 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 2007, Chengdu, China
Abstract
Many changes of various parameters in photonic crystal cause changes of band structure and thus cause changes of light propagation through photonic crystal. The paper is mainly concerned with the study of negative refraction phenomenon dependent on wave guide width in 2D photonic crystal which consists of a hexagonal lattice of circular dielectric rods with Si. It is separately carried on the elaboration from three aspects: along with the accretion of wave guide width in photonic crystal, how the incident light frequency range in which the negative refraction phenomenon presents is changed; under identical incident light frequency, if the negative refraction phenomenon presents, then what the transformation of corresponding negative refractive index is ; if the value of refractive index of -1 is obtained, what the trend of e incident light frequency is.
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Li Feng, Li Feng, Binming Liang, Binming Liang, Zhuo Li, Zhuo Li, Jiabi Chen, Jiabi Chen, Songlin Zhuang, Songlin Zhuang, } "Negative refraction phenomenon dependent on wave guide width", Proc. SPIE 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 67222Z (14 November 2007); doi: 10.1117/12.783351; https://doi.org/10.1117/12.783351
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