14 November 2007 Electronic trap effect of spectral sensitizing dye adsorbed on the surface of the film of silver chloride microcrystals
Author Affiliations +
Proceedings Volume 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies; 67223B (2007) https://doi.org/10.1117/12.783520
Event: 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 2007, Chengdu, China
Abstract
The photoelectron decay characteristic of AgCl mircrocrystals, which are adsorbed with the green-sensitive cyanine dye, has been obtained by using microwave absorption and phase-sensitive measurement technique. Combined with the absorption spectra of cubic AgCl emulsion sensitized by green-sensitive cyanine dye, the influence of green-sensitive cyanine dye adsorption at various adsorbing concentration on the surface structure of cubic AgCl microcrystals is investigated. It is found that when the concentration is less than 0.02ml(5.0mg/ml)/40g emulsion, the dye J-aggregate is not formed on the surface of silver chloride microcrystals, the surface of AgCl is decorated by the dye, the dye takes place shallow electron trap effect; when the sensitive concentration is more than 0.2ml (5.0mg/ml)/40g emulsion, the dye J-aggregate is formed on the surface of silver chloride microcrystals, the Agi+ of AgCl microcrystal surface is increased, the dye takes place the deep electron trap effect
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xiao-Wei Li, Xiao-Wei Li, Ji-Xian Zhang, Ji-Xian Zhang, Rong-Xiang Zhang, Rong-Xiang Zhang, Wei-Dong Lai, Wei-Dong Lai, Li Li, Li Li, Xiu-Hong Dai, Xiu-Hong Dai, Guang-sheng Fu, Guang-sheng Fu, } "Electronic trap effect of spectral sensitizing dye adsorbed on the surface of the film of silver chloride microcrystals", Proc. SPIE 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 67223B (14 November 2007); doi: 10.1117/12.783520; https://doi.org/10.1117/12.783520
PROCEEDINGS
6 PAGES


SHARE
Back to Top