Paper
14 November 2007 Rock fracture image acquisition and analysis
W. Wang, Jia Zongpu, Liwan Chen
Author Affiliations +
Proceedings Volume 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies; 67223J (2007) https://doi.org/10.1117/12.783561
Event: 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 2007, Chengdu, China
Abstract
As a cooperation project between Sweden and China, this paper presents: rock fracture image acquisition and analysis. Rock fracture images are acquired by using UV light illumination and visible optical illumination. To present fracture network reasonable, we set up some models to characterize the network, based on the models, we used Best fit Ferret method to auto-determine fracture zone, then, through skeleton fractures to obtain endpoints, junctions, holes, particles, and branches. Based on the new parameters and a part of common parameters, the fracture network density, porosity, connectivity and complexities can be obtained, and the fracture network is characterized. In the following, we first present a basic consideration and basic parameters for fractures (Primary study of characteristics of rock fractures), then, set up a model for fracture network analysis (Fracture network analysis), consequently to use the model to analyze fracture network with different images (Two dimensional fracture network analysis based on slices), and finally give conclusions and suggestions.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
W. Wang, Jia Zongpu, and Liwan Chen "Rock fracture image acquisition and analysis", Proc. SPIE 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 67223J (14 November 2007); https://doi.org/10.1117/12.783561
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KEYWORDS
Image analysis

Analytical research

Ultraviolet radiation

Image processing

Image resolution

Network security

Cameras

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