26 November 2007 Method for 3D profilometry measurement based on contouring moire fringe
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Proceedings Volume 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 672302 (2007) https://doi.org/10.1117/12.782675
Event: 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 2007, Chengdu, China
Abstract
3D shape measurement is one of the most active branches of optical research recently. A method of 3D profilometry measurement by the combination of Moire projection method and phase-shifting technology based on SCM (Single Chip Microcomputer) control is presented in the paper. Automatic measurement of 3D surface profiles can be carried out by applying this method with high speed and high precision.
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Zhiwei Shi, Zhiwei Shi, Juhua Lin, Juhua Lin, } "Method for 3D profilometry measurement based on contouring moire fringe", Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 672302 (26 November 2007); doi: 10.1117/12.782675; https://doi.org/10.1117/12.782675
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