Analysis of infrared interferometry with laser noises

Xiangke Cao; Rongzhu Zhang

doi:10.1117/12.782923

27 November 2007 Analysis of infrared interferometry with laser noises

Xiangke Cao, Rongzhu Zhang

Proceedings Volume 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 67230M (2007) https://doi.org/10.1117/12.782923
Event: 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 2007, Chengdu, China

Abstract

Based on wave equation of light, with the technique of statistic analysis in signal and system field, an analysis model of semiconductor laser noise has been established. With this model the author analyzes the infrared interferometer used for optical surface test. The disturbance of phase noise acting on the interference field in the precise test process is discussed in detail. Numeric algorithm is employed to calculate the optical field distribution with phase noise propagating through an interferometer system.

Citation Download Citation

Xiangke Cao and Rongzhu Zhang "Analysis of infrared interferometry with laser noises", Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 67230M (27 November 2007); https://doi.org/10.1117/12.782923

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