27 November 2007 Novel algorithm to improve sampling frequency of LSF
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Proceedings Volume 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 67231Z (2007) https://doi.org/10.1117/12.783212
Event: 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 2007, Chengdu, China
Abstract
For having sample spectrum, slitting is often used as characteristic objects for OTF measurement. The common measurement methods of OTF from slit image data are firstly presented in this paper. According to deep analysis of image energy distribution of tiny tilted slit, Sub-Extremum Minimum Difference Method (SEMDM) is established. The method uses the rows with energy distributions of slit image stagger one pixel exactly to determine the scale of sub-pixel segment, and LSF data with 3 to 5 times sampling frequency are achieved by several-line low sampling frequency LSF data interpolation Practical test results prove that the algorithm is correct and reliable.
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Weihong Ma, Weihong Ma, Changlong Cai, Changlong Cai, Lihong Yang, Lihong Yang, } "Novel algorithm to improve sampling frequency of LSF", Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 67231Z (27 November 2007); doi: 10.1117/12.783212; https://doi.org/10.1117/12.783212
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