27 November 2007 High resolution test for large optics with sub-pixel phase retrieval method
Author Affiliations +
Proceedings Volume 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 67232C (2007) https://doi.org/10.1117/12.783297
Event: 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 2007, Chengdu, China
Abstract
For large mirror test, there is growing need to increase the spatial resolution of the test instrument, when testing large optics. A novel test method is introduced to achieve high spatial resolution based on phase retrieval method that splits each pixel of CCD into sub-pixels by numeric processing. Because the more images are captured, the more information of wave front is gathered to confirm the state of each sub-pixel, the sub-pixel phase retrieval needs multi-images and also more calculation power to process these images. Numerical experiments shows that more than 4 times of resolution of traditional phase retrieval method can be achieved by this method.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xiaojun Hu, Xiaojun Hu, Shengyi Li, Shengyi Li, Yulie Wu, Yulie Wu, } "High resolution test for large optics with sub-pixel phase retrieval method", Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 67232C (27 November 2007); doi: 10.1117/12.783297; https://doi.org/10.1117/12.783297
PROCEEDINGS
7 PAGES


SHARE
RELATED CONTENT


Back to Top