17 January 2008 Effect of electric field on oriented poly(vinylidene fluoride) (PVDF) thin films prepared by vacuum evaporation
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Proceedings Volume 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 67232D (2008) https://doi.org/10.1117/12.783300
Event: 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 2007, Chengdu, China
Abstract
Thin oriented films of α phase PVDF were prepared by vacuum evaporation method. The technique of X-ray Diffraction and FTIR were used to analyze the crystalline microstructure of two types of α-form film. The thin oriented films have single pure α phase and the preferred crystalline orientation is on the (020) orientation paralleling to the substrate. The effect of electric field on crystal form of PVDF films during deposition has been studied in the presence of electric field during deposition process, in which the orientation is perpendicular to substrate. The diffraction pattern of PVDF shows that the intensity of diffraction peak decreases with the increase of DC voltage value, and increases with the increase of AC voltage value. The magnitude and direction of electric field have remarkable effect on crystal growth.
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YingXue Hui, YingXue Hui, WeiGuo Liu, WeiGuo Liu, WenLiang Luo, WenLiang Luo, Chen Yang, Chen Yang, XiaoLing Niu, XiaoLing Niu, "Effect of electric field on oriented poly(vinylidene fluoride) (PVDF) thin films prepared by vacuum evaporation", Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 67232D (17 January 2008); doi: 10.1117/12.783300; https://doi.org/10.1117/12.783300
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