27 November 2007 Study on automatic measurement of tiny-size
Author Affiliations +
Proceedings Volume 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 67232E (2007) https://doi.org/10.1117/12.783302
Event: 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 2007, Chengdu, China
Abstract
The computer vision technology is applied into automatic measurement of tiny-size like filament. The authors utilize digit image processing technology to analyze and research image data, extract edge contour of objects, consequently obtain information including edge position and dimension of objects. The information can be used to obtain practical dimension of objects after being calibrated and analyze objects' parameters and find out eligible objects.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shijun Wang, Shijun Wang, Pingan Mu, Pingan Mu, Shuguang Dai, Shuguang Dai, Weiwei Liu, Weiwei Liu, } "Study on automatic measurement of tiny-size", Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 67232E (27 November 2007); doi: 10.1117/12.783302; https://doi.org/10.1117/12.783302
PROCEEDINGS
6 PAGES


SHARE
RELATED CONTENT

Extraction and analysis of the image in the sight field...
Proceedings of SPIE (November 05 2010)
General Purpose Vision Sensor
Proceedings of SPIE (March 16 1983)
Application of SKIPSM to binary template matching
Proceedings of SPIE (October 02 1994)
Software SKIPSM implementation for template matching
Proceedings of SPIE (February 11 2001)

Back to Top