Application of semiconductor laser on big dimension measuring system

Hongtao Zhang; Xuhua Zhai; Xun Zhou; Yanxiu Bi; Gang Di; Xu Han

doi:10.1117/12.783637

17 January 2008 Application of semiconductor laser on big dimension measuring system

Hongtao Zhang, Xuhua Zhai, Xun Zhou, Yanxiu Bi, Gang Di, Xu Han

Proceedings Volume 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 67234G (2008) https://doi.org/10.1117/12.783637
Event: 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 2007, Chengdu, China

Abstract

The structure and principles of an optical non-contact measuring system of large-dimension diameter were analyzed in detail in the paper. This system can be used to measure up to the diameter of 2200 millimeters. And it also can be used to measure the coaxiality of inner and outside of cirque. Moreover, the system can realize measurement of on-line parameters in processing. The ultimate errors in measuring large-dimension diameter are less than 0.02 millimeters.

Citation Download Citation

Hongtao Zhang, Xuhua Zhai, Xun Zhou, Yanxiu Bi, Gang Di, and Xu Han "Application of semiconductor laser on big dimension measuring system", Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 67234G (17 January 2008); https://doi.org/10.1117/12.783637

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