Paper
27 November 2007 Aggregate particle image segmentation
W. X. Wang
Author Affiliations +
Proceedings Volume 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 67234X (2007) https://doi.org/10.1117/12.783690
Event: 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 2007, Chengdu, China
Abstract
The most important and hard part of computer vision for aggregates, is segmentation. Segmentation can be divided into two steps, one is segmentation based on gray levels (called image binarization sometimes) in which a gray level image is processed and converted into a binary image, the other is segmentation based on particle shapes in a binary image, in which overlapping and touching particles will be split, and over-segmented particles will be merged based on some prior knowledge such as shape and size etc. In this paper, according to authors' work experiences, several kinds of aggregate image segmentation algorithms are analyzed and discussed; therefore, the suggestions for aggregate image segmentation are proposed.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
W. X. Wang "Aggregate particle image segmentation", Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 67234X (27 November 2007); https://doi.org/10.1117/12.783690
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Cited by 1 scholarly publication.
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KEYWORDS
Image segmentation

Particles

Image processing algorithms and systems

Algorithm development

Detection and tracking algorithms

Binary data

Image processing

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