Aggregate particle image segmentation

W. X. Wang

doi:10.1117/12.783690

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27 November 2007 Aggregate particle image segmentation

W. X. Wang

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Proceedings Volume 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 67234X (2007) https://doi.org/10.1117/12.783690
Event: 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 2007, Chengdu, China

Abstract

The most important and hard part of computer vision for aggregates, is segmentation. Segmentation can be divided into two steps, one is segmentation based on gray levels (called image binarization sometimes) in which a gray level image is processed and converted into a binary image, the other is segmentation based on particle shapes in a binary image, in which overlapping and touching particles will be split, and over-segmented particles will be merged based on some prior knowledge such as shape and size etc. In this paper, according to authors' work experiences, several kinds of aggregate image segmentation algorithms are analyzed and discussed; therefore, the suggestions for aggregate image segmentation are proposed.

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W. X. Wang "Aggregate particle image segmentation", Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 67234X (27 November 2007); https://doi.org/10.1117/12.783690

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