On-line inspection system of surface quality for medical film

Wei Lu; Hui-min Yan; Wen Qiao

doi:10.1117/12.782512

19 November 2007 On-line inspection system of surface quality for medical film

Wei Lu, Hui-min Yan, Wen Qiao

Proceedings Volume 6724, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems; 67240H (2007) https://doi.org/10.1117/12.782512
Event: 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 2007, Chengdu, China

Abstract

This paper presents an on-line inspection instrument of surface quality for medical film. Using LED light to illumine moving medical film from one side, in the other side LED transmitted light is focused on linear CCD of 2048 pixels. With CCD, optical information is converted into electrical information which is fast processed by a hybrid circuit to get the size and position of the tiny smudge. An adaptive threshold method is invented in the circuit to extract exactly the information of different kinds of tiny smudges. This instrument has already been proved to be of high stability with better spatial resolution than 1mmx1mm in the condition of an inspection range of 1.4m and a film moving speed of 2m/s. Besides, a further all-digital processing method for increasing inspection resolution and distinguishing tiny smudges and normal crystals on e medical film is also put forward.

Citation Download Citation

Wei Lu, Hui-min Yan, and Wen Qiao "On-line inspection system of surface quality for medical film", Proc. SPIE 6724, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems, 67240H (19 November 2007); https://doi.org/10.1117/12.782512

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
4 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Inspection

Charge-coupled devices

Spatial resolution

Signal processing

Light emitting diodes

Analog electronics

Manufacturing

Show All Keywords

Keywords/Phrases

Search In:

Publication Years