21 November 2007 Mach-Zehnder interferometer for auto-collimated beams in non-channel photonic crystals
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Proceedings Volume 6724, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems; 67241H (2007) https://doi.org/10.1117/12.782887
Event: 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 2007, Chengdu, China
Abstract
We propose a auto-collimating Mach-Zehnder interferometer (MZI) for refractive index measurement and optical on/off switch in non-channel photonic crystals (PhCs) by filling the lattice with fluid of different refractive index. The designed MZI, consisting of non-channel waveguides, optical bends and beam splitters for auto-collimated beams, is actively controlled by changing the refractive index of background material in one of its two optical paths. Equi-frequency contour (EFC) analysis and finite-difference time-domain (FDTD) simulations are used to quantify the optical properties of auto-collimation based bends, beam splitters and MZI. Simulation results show that the output intensities exhibit sinusoidal curves as a function of refractive index, and the π− phase shift is obtained as the background refractive index changes as small as Δn=0.16. The novel interferometer demonstrates a great potential to act as a sensitive refractive index sensor or as an intensity modulator in optical circuits.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xiaopeng Shen, Xiaopeng Shen, Kui Han, Kui Han, Yifeng Shen, Yifeng Shen, Xianqing Yang, Xianqing Yang, Gang Tang, Gang Tang, Haipeng Li, Haipeng Li, Ziyu Wang, Ziyu Wang, } "Mach-Zehnder interferometer for auto-collimated beams in non-channel photonic crystals", Proc. SPIE 6724, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems, 67241H (21 November 2007); doi: 10.1117/12.782887; https://doi.org/10.1117/12.782887
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