Inspection results for 32nm logic and sub-50nm half-pitch memory reticles using the TeraScanHR

Jean-Paul Sier; William Broadbent; Farzin Mirzaagha; Paul Yu

doi:10.1117/12.747295

25 October 2007 Inspection results for 32nm logic and sub-50nm half-pitch memory reticles using the TeraScanHR

Jean-Paul Sier, William Broadbent, Farzin Mirzaagha, Paul Yu

Proceedings Volume 6730, Photomask Technology 2007; 67302A (2007) https://doi.org/10.1117/12.747295
Event: SPIE Photomask Technology, 2007, Monterey, California, United States

Abstract

Results from the recently available TeraScanHR reticle inspection system were published in early 2007. These results showed excellent inspection capability for 45nm logic and 5xnm half-pitch memory advanced production reticles, thus meeting the industry need for the mid-2007 start of production. The system has been in production use since that time. In early 2007, some evidence was shown of capability to inspect reticles for the next nodes, 32nm logic and sub-50nm half-pitch memory, but the results were incomplete due to the limited availability of such reticles. However, more of these advanced reticles have become available since that time. Inspection results of these advanced reticles from various leading edge reticle manufacturers using the TeraScanHR are shown. These results indicate that the system has the capability to provide the needed inspection sensitivity for continued development work to support the industry roadmap.

Citation Download Citation

Jean-Paul Sier, William Broadbent, Farzin Mirzaagha, and Paul Yu "Inspection results for 32nm logic and sub-50nm half-pitch memory reticles using the TeraScanHR", Proc. SPIE 6730, Photomask Technology 2007, 67302A (25 October 2007); https://doi.org/10.1117/12.747295

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